TY  - GEN
AU  - Torrens, Gabriel
AU  - Alheyasat, Abdel
AU  - Alorda, Bartomeu
AU  - Bota, Sebastia A
PY  - 2022
DO  - 10.3390/electronics11010135
UR  - https://hdl.handle.net/20.500.12105/23525
AB  - This work proposes a methodology to estimate the statistical distribution of the probability that a 6T bit-cell starts up to a given logic value in SRAM memories for PUF applications. First, the distribution is obtained experimentally in a 65-nm CMOS...
LA  - eng
PB  - Multidisciplinary Digital Publishing Institute (MDPI)
KW  - SRAM
KW  - Memory
KW  - PUF
KW  - Cell mismatch
KW  - SRAM-PUF
TI  - SRAM-Based PUF Reliability Prediction Using Cell-Imbalance Characterization in the State Space Diagram
TY  - research article
ER  -